Co-founder, President, and CEO
Steven Slupsky co-founded Scanimetrics with Brian Moore and is one of the visionaries driving the company. He is actively involved in many aspects of Scanimetrics, including technology development, intellectual property management, business development, and marketing.
Slupsky has worked in the semiconductor, advanced microelectronics, and embedded systems design fields for 20 years. He served as entrepreneur, design engineer, and architect, and later held leadership and management roles on many advanced technology projects. As one of the main inventors for Scanimetrics technologies, Slupsky has patented several wireless techniques for wafer-level semiconductor testing.
Prior to joining Scanimetrics, Slupsky was Vice President and Chief Technology Officer at AMC Technologies and also served as Vice President at Micralyne Inc. He holds a Bachelor of Science and a Masters degree in Electrical Engineering from the University of Alberta.